MS44-P06 Low temperature X-ray investigations using a Guinier diffractometer system Michael Tovar (Helmhotz-Zentrum Berlin, Berlin, Germany) Galina Gurieva (Helmholtz-Zentrum Berlin, Berlin, Germany) Susan Schorr (Helmholtz-Zentrum Berlin / Freie Universit├Ąt Berlin, Berlin, Germany)email: tovar@helmholtz-berlin.deUsing a Guinier diffractometer for low temperature X-ray diffraction allows accurate investigations of lattice parameters at non-ambient conditions. Therefore, we are able to trace subtle changes in cell metrics such as cell parameter deviations or symmetry breaking. In this contribution, we will apply this technique particularly to kesterite-type solar absorber materials. For Kesterite-type materials unusual thermal behaviour like negative thermal expansion is reported (1). Measurements from 10 to 300 K were collected. Description of the instrument and outcome of low temperature X-ray investigations will be presented and compared to formerly results.References:

(1) Schorr, S., Sheptyakov, D., J. Phys.: Condens. Matter 20 (2008), 104245
Keywords: Low temperature, Guinier, Phase transition