MS24-P03 NanoMAX Beamline, a nanoprobe beamline for Scattering and Imaging at MAX IVNanoMAX is a hard X-ray nanoprobe beamline at the 3 GeV multi-bend achromat storage ring MAX IV, Lund, Sweden . The beamline is designed to utilize the uniquely high brilliance of the facility to achieve nanometer-sized coherent foci with high photon intensity. The small focus is used for scanning imaging with the main methods nano-diffraction, phase and absorption contrast, coherent diffractive imaging and ptychography - in forward and Bragg condition. The beamline optics has been briefly presented earlier .
The beamline will have two experimental stations when the buildup phase ends 2019/2020. One experimental station using Kirkpatrick-Baez mirror optics (KB) for focusing. The KB system gives a diffraction limited probe of 40 nm (24 keV) - 200 nm (5 keV) with 100 mm working distance from optics to sample position. The generous space will allow for versatile sample environments. Three main detectors are planned for or installed at the station; a megapixel photon counting area detector in forward direction, a compact photon counting area detector in off-axis position on a commercial industry robot and a 3-element Germanium X-ray fluorescence detector. A compact two axis high precision goniometer will allow advanced studies of ordered samples with diffractive methods. Continuous sample scanning is implemented in a basic version and will be further developed for efficient data acquisition. The design of the second experimental station is ongoing and first tests are anticipated early 2019.
We have provided beamtime to a handful user experiments during the first year of operation. Experiments in X-ray fluorescence, wide-angle scattering, nano-diffraction and ptychography have been executed. To achieve optimal performance from the super-polished KB-mirrors we have developed a simple procedure to measure focus astigmatism by scanning a Siemens star like test structure in ptychographic mode. The test sample image and the probe are reconstructed at the sample position using diffraction data from an inline pixel detector . The probe is then propagated along the beam direction to show the beam profile, in vertical and horizontal plane, as seen in figure 1 bottom parts. References:
 P F Tavares et al, (2014), J. Synchrotron Rad., 21, p. 862.
 U Johansson, U Vogt and A Mikkelsen, (2013),Proc. SPIE 8851, 88510L.
 B. Enders P. Thibault, (2017), Proc. R. Soc A 472 20160640 Keywords: Nanofocus, Hard X-ray, diffraction