MS23-P11 Pushing the Limits of Material Characterization using Transmission Electron Microscopy at the University of OviedoElectron microscopy is at the forefront of many characterization methodologies used nowadays to obtain valuable structural information for different types of materials down to the atomic scale. In particular, our facility JEOL JEM-2100F provides a platform for combining different characterization techniques, such as high-resolution transmission electron microscopy (HR-TEM); electron diffraction techniques (selected area electron diffraction: SAED, nano-beam electron diffraction: NBD and 3D precession electron diffraction tomography); scanning transmission electron microscopy (STEM) in both bright-field (BF) and high-angle annular dark-field (HAADF) modes; energy dispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS). In this communication, we shade the light on outstanding examples that show the beauty of using our facility to effectively characterize inorganic, hybrid inorganic-organic, and biological samples.References:
1. Pustovarenko, A., Goesten,M.G., Sachdeva,S., Shan,M., Amghouz,Z et al. (2018) Advanced Materials. 17, 1707234.
5. Adawy, A., Amghouz, Z., van Hest,J.C.M., & Wilson, D. A. (2017). Small. 13, 28(3)
6. García-Glez, J., Amghouz, Z., da Silva, I., Ania, C. O., Parra,J.B., Trobajo,C. & García-Granda, S. (2017). Chemical Communications, 53 (14), 2249-2251.
Keywords: HR-TEM, Electron diffraction, EDX