MS39-P02 Inside source x-ray fluorescent holography on NiO Gyula Faigel (Wigner Research Centre for Physics, Budapest, Hungary) Gábor Bortel (Wigner Research Centre for Physics, Budapest, Hungary) Miklós Tegze (Wigner Research Centre for Physics, Budapest, Hungary) Borislav Angelov (ELI Beamlines Project Division,, Dolní Břežany, Czech Republic)email: gf@szfki.huAtomic resolution x-ray holography can be realized by using the atoms of the sample as inside sources [1,2] or as inside detectors [3]. However, until now there were only very few experiments in which the atoms played the role of inside sources. The reason is twofold: (i) technically, inside detector experiments are much easier; (ii) using atoms as inside detectors one can measure holograms at many energies on the same sample, which helps the reconstruction process. In this work we show that using new technical developments, inside source holograms can be taken much faster (within 1 second at a synchrotron source) than inside detector holograms and applying a sophisticated evaluation method high quality reconstruction from a single energy hologram can also be obtained. The adaptation of this technique to XFEL-s opens a series of new possibilities in structural studies. For example, one can obtain 3D structural information of very short lived transient structures, appearing in highly non-ambient conditions: high pressure, high magnetic fields, high temperatures, where experimental conditions cannot be repeated with exact control.References:

[1] Szöke, A. (1986). Short Wavelength Coherent Radiation: Generation and Applications, AIP Conference Proceedings No. 147, American Institute of Physics, New York, 361–367.

[2] Tegze, M., Faigel, G. (1996). Nature 380, 49–51.

[3] Gog, T., Len, P. M., Materlik, G., Bahr, D., Fadley, C. S., Sanchez-Hanke, C., (1996). Phys. Rev. Lett. 76, 3132–3135.

Keywords: x-ray holography, atomic resolution